以下为句子列表：
英文: Abstract: At first,this paper analyces the open defect of CMOS RAM address decoder,it comes out that one type open defect cannot be detected by march test algorithm,and then we give the test method of this type undetectable fault and the design scheme wit
中文: 文摘:对CMOS存储器中地址译码器的开路故障进行了分析和分类，得出了其中有一类开路故障不能用常用的测试算法可靠的测试出，给出了测试该类开路故障的测试方法以及针对该类开路故障的容错性设计方案。
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